Wed 20 Thu 21 Fri 22
08:00-09:00 REGISTRATION
Plenary Session - Grand Ballroom 1
09:00-09:15 OPEN CEREMONY
Chair: Antonio H. Castro Neto (National University of Singapore, Singapore)
09:15-09:45 KEYNOTE Singapore Research Innovation Enterprise Journey George Loh,
National Research Foundation of Singapore (NRF), Singapore
09:45-10:30 PLENARY Graphene update Andre Geim,
University of Manchester, UK
10:30-11:00 Coffee Break – Poster session A & Exhibition
Chair: Stephan Roche (ICREA, ICN2, Spain)
11:00-11:30 KEYNOTE Synthesis and OLED use of high-quality graphene by CVD Hui-Ming Cheng,
Chinese Academy of Sciences, China
11:30-12:00 KEYNOTE High-Quality Epitaxial Thin Films of Topological Dirac Semimetal Na3Bi Michael Fuhrer,
Monash University, Australia
12:00-12:30 KEYNOTE Construction and Functionality of Novel and Intrinsically Patterned 2D Materials Hong-Jun Gao,
Chinese Academy of Sciences, China
12:30-13:30 Lunch
13:30-14:00 Poster Session A
Chair: Yoshihiro Iwasa (University of Tokyo, Japan)
14:00-14:30 INVITED Structural Design of 2D Materials for Energy Storage Kian Ping Loh,
NUS/CA2DM, Singapore
14:30-14:45 Graphene derivatives as interface materials for organic photovoltaic cells Jian Zhang,
Guilin University of Electronic Technology, China
14:45-15:15 INVITED Macroscopic Organic 2D Crystals and Beyond Xinliang Feng,
Technische Universitaet Dresden, Germany
15:15-16:00 Coffee Break – Poster session A & Exhibition
16:00-16:45 Poster session A
Chair: Michael Fuhrer (Monash University, Australia)
16:45-17:15 KEYNOTE Iontronics of 2D materials Yoshihiro Iwasa,
University of Tokyo, Japan
17:15-17:30 2D inserte Metal / Semiconductor interface : an attractive candidate for semiconductor MOSFET contact Min-Hyun Lee,
Samsung Advanced Institute of Technology, South Korea
17:30-17:45 Multidimensional Hetero-integration of Graphene and h-BN towards Nano-electronics Haomin Wang,
Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences, China
17:45-18:00 2D MoS2 and heterostructures: Processing by CVD and ALE and Raman spectroscopy based quality control Ravi Sundaram,
Oxford Instruments, UK